M.Sc. Fenhua Zhen


Conferences and Workshops

  1. Matthias Beyer, Winfried Dulz and Fenhua Zhen, "Automated TTCN-3 Test Case Generation by means of UML Sequence Diagrams and Markov," IEEE Proc. of 12th Asian Test Symposium, Xi'an, China, pp. 102-105, November 2003
  2. Winfried Dulz and Fenhua Zhen, "MaTeLo - Statistical Usage Testing by Annotated Sequence Diagrams, Markov Chains and TTCN-3," IEEE Proc. of Third International Conference on Quality Software (QSIC 2003), Dallas, Texas, pp. 336-342, November 2003

Technical Reports and Regional Workshops

  1. Winfried Dulz and Fenhua Zhen, "How to Use XML Descriptions for Generating Markov Chain Usage Models from Sequence Diagrams," Friedrich-Alexander-Universität Erlangen-Nürnberg, technical report 06/02, 2002